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Fixes: 

• Minor improvements on Retest Pin and Lot Control Program Loading.
• Minor improvements on 2D Map display, Reset, Rotate and Flip buttons.
• Fixed Parallel Testing error on MPT-LR during Cycle Run.
• Fixed Loop Test handling of Test Programs configured for parallel testing in XT and LRX.
• Fixed errors in Load Binary Log, Clear Log and Merge Log for test data with pin count greater than 10,000.
• Fixed bug when running Calibration + Verification using an 8K Cal board on a 16K XT Tester.
• Fixed hang-up states on Short/Open Test.

New:

• First prod release supporting MPT-TIU tester.
• User adjustable delay time before measurement (0 to 10000ms) supporting all Test Types.
• User adjustable discharge time after measurement (0 to 10000) supporting CRES Test Type.
• Function to efficiently disable pins on the Test Program based on Test Result. Disable Fail or Disable Pass option.
• Function to quickly strip-out all Disabled Pins in a Test Program.
• Improved 2D map display when running Listed Fails option during Calibration + Verification.
• Custom Z-Test & Z-Rest for FDR run.
• Support FDR run on Test at Cycle Zero option.
• Added FDR settings on MTC Recipe.  

Fixes: 

• Minor improvements on 2D Map plotting using the Alternative X-Y coordinates defined in the Test Program.
• Minor improvements on Tester Connection process.
• Overlaid measurements on the 2D Ball Map are now rounded off to single decimal place with option to use contrasting color between the Ball Map and Measurement.
• Minor improvements on Tester Connection process.

New:

• Support for Test Boards with Board ID Circuit. 
• Support for LRX version 2 master card, enabling access to board EEPROM. 
• MTC max load cell increased to 2000lb.

Fixes: 

• Minor fixes on MTC Interlock Status and MTC Velocity Slider.
• Application of XT Parameter SLOTCOMDELAY from the SystemVariables.

New:

• Updated the Board Verification process to be aligned with new board checking mechanics. Existing boards are auto updated during their first run on this software version.
• Updated automated focus cal.
• Optional integration of Test Mean during the Pass/Fail evaluation of Test Result.
• MTC Debug log option for Engineer Access Level.

Fixes: 

• Fixed minor bugs on 2D Map display for MPT-LRX, MPT-XT using LR Test Program and charting of disabled site 
• Fixed error when loading an LR program variant on XT tester.

New:

• Updated automated focus cal. 
• Updated the Pass/Fail evaluation process for Combine Maps option.
• Updated automated focus cal.
• First production release version supporting LRX tester.
• Added support for automated focus cal.
• Update on the MTC Connection process.
• First version supporting LRX tester.
• Added feature for XT supporting selectable Quadrant for test measurement

Fixes: 

• Minor improvements on SHORT & OPEN Test for MPT-XT and inclusion of 3 Precision levels similar to that of MPT-LR.
• Improvements on the saving of MTC Recipe Cycle logs.
• Improvements on the Retest Fails flow.

New:

• Added support for customizing the log file name format which is used as the standard structure for the different system log files. 
• Added new data columns for the PivotTable log and is now saved in .CSV format. 
• Added UUT Insertions input field which can be used as part of the log file name format customization.

Fixes:

• Fix occurrence of instrumentation error when reading EEPROM data.

Fixes:

• Bug fix for Analysis mode under Retrieve Logs.

New:

• Added support for entering the Completed Cycles value in the Cycle Setup.
• Initialize the input fields of Enter Serial Numbers Window with the UUT Serial value during Lot Control.
• Added a Clear All Serials button on the Enter Serial Numbers Window for easier changing of serial numbers for a multiple socket setup. 

Fixes:

• Stability improvements for SHORT Test, OPEN Test and HDRR Test.

Fixes:

• Included the updated FTDI Driver into the installation package to address potential USB connection issues after a Windows Update.
• Fixed Save All Map bug not picking the config parameters.

Fixes:

• Per Pin Statistics now doesn’t include data from a PCB Check Flow and Test Events which are marked as MissTest.
• Fixed error on the TestList pass/fail condition when saving a Binary Log.
• Fixed bug on SHORT/OPEN Test for MPT-XT. (occurrence of false short measurement after a pin fails PCB Check).

New:

• Support for 3 Precision levels on SHORT/OPEN Test for MPT-LR.
• 2 Mega Ohm measurement cap for SHORT/OPEN Test.
• Support for 3 Precision levels on HDRR_HILO Test.
• Improvements on the HDRR_HILO Test and addition of HDRR_FCAL Test.

Fixes:

• Fixed bug on mouse left click button which links a wrong pin from scatter chart to 2D package map.

New:

• 1 Mega Ohm measurement cap for CRES Test.
• Added PCB Check Test flow for failed pin during SHORT/OPEN Test.

Fixes:

• Fixed bug on Lot Control Variable selection values not properly cleared.

New:

• Added config parameter to auto apply UI language translation during tester connection process.
• Added config parameter to include or exclude disabled pins during the creation of Pivot Logs.
• Align the UUT Serial and UUT Lot label on Data Log with the values used in the UI.